10 year anniversary edition

Measuring Inorganic Impurities in Semiconductor Manufacturing

Download compendium
Over 20 methods for measuring dissolved and particulate contamination

The new edition of the Agilent ICP-QQQ Semiconductor Applications Compendium contains 20+ optimized methods to measure inorganic contamination in:

Wafer materials

Ultrapure water and hydrogen peroxide

Process chemicals, acids, and solvents

Precursor and process gases

The methods include instrument configuration and tuning parameters, sample and standard preparation details and representative results.

Download compendium
DE57057193
Please fill out this form to get immediate access to the Semiconductor Applications Compendium

Your Personal Data
* This field is required
First Name*
Last Name*
Title
Mr.
Ms.
Dr.
Assoc Prof.
Prof.
Others
Company/Org*
Address*
City*
State/Province
Postal Code*
Phone*
Country*
Language
Email Address*
Your Purchase Plan
I have purchase plans
Yes
No
Not now
Technique(s)
Technique - Chromatography
Technique - Mass Spectrometry
Technique - Spectroscopy
Technique - Columns & Supplies
Technique - Automation
Technique - Dissolution
Technique - Genomics
Technique - Pathology
Technique -Electrophoresis
Technique -Sample Preparations
Technique -Vacuum Technologies
Technique - Software & Informatics
Technique - Services & Support
Technique - Cell Analysis
Technique - Flow Cytometers - NovoCyte
Technique - Microplates
Budget available:
Yes
No
In progress
Other
My buying timeframe is:
Immediate
Within 3 months
4-12 months
More than 12 months
Please have an Agilent Representative contact me via email or phone.
Any other questions, comments or suggestions?
Yes, Agilent may share my data I submitted with this form with Agilent Authorized Distributors.
Yes, I would like to receive email updates about Agilent products, services and events.
For full details of how we will treat your information please view our privacy policy: www.agilent.com/home/privacy-policy

Back to Top

10 year anniversary edition

Measuring Inorganic Impurities in Semiconductor Manufacturing

Over 20 methods for measuring dissolved and particulate contamination

Please fill out this form to get immediate access to the Semiconductor Applications Compendium

Your Personal Data

Your Purchase Plan